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Quality Assurance Test Facility


  • Measurement of Surface Roughness


    • Range: 0-200mm (linear)
    Roughness value capability: 0.01 to 200 microns
    Measurement of roughness, waviness and other parameters as per ISO/DIN standard.


  • Outgassing Measurement


    • It measures Total Mass Loss, Collected Volatile Condensable Material confirming to Test standard: ESA-PSS-01-702 and ASTM-E-595 ,TML < 1.0%, CVCM < 0.10%

    Test material/ sample requirements: (min) 300mg, bead in cured/dried form of size: (max) 7mm diameter or square made from polymeric materials. up to TML less than 20.0%,CVCM less than 0.01%


  • RF probing station for MMIC die characterization


    • RF Frequency: DC - 67 GHz
    Temperature Limits: -20 to +125 deg C
    Wafer diameter: Up to 6 inch
    Die size (min):    0.7mm x 0.7mm x 0.1mm
    Probe configuration & Pitch: GS,SG,GSG; 100,150,200 microns


  • C- Scanning Acoustic Microscope (SAM) imaging


    • This imaging facility is useful for non-destructive internal visual inspection of components. The system has capability of 10 micron resolution. Object size of 30 mm x 30 mm can be inspected.

  • Laser based microscopy inspection up to 17000 magnification
  • AOI for large size PCBs ( 1m X 0.3 m)
  • VLSI test facilities

    • VLSI Tester has per pin architecture, 512 digital I/O pins with 100 MHz data rate, 4 source and capture analog pins having 15 MHz bandwidth, 20 channels 0-30V DC power supply and 4 channels 0-75V power supply.



  • Measurements of inductance, capacitance and Resistance up to 3 GHz

    • Resistance:   0.01 mΩ to 2 GΩ
    Capacitance: 1.0 pF to 1.0F
    Inductance:   0.1 nH to 2.0kH
    Dissipation Factor: 0.00001 to 1000

  • Inspection of narrow cavities

    • Probe Size : Diameter : 0.9 mm
    Length : 1.0 meter
    Defect size measurement & recording. Video & still photograph for defect library.

  • Test and Evaluation

    • Transmission & Reflection parameter measurements ( s parameters): 10 MHz to 40 GHz
    Spurious, Harmonics & IMD measurements: 10 MHz to 110 GHz
    RF power & frequency measurements: 10 MHz to 110 GHz
    Noise figure measurements: 10 MHz to 110 GHz
    Phase noise measurements: 10 MHz to 13 GHz

  • EMI EMC test facility

    • Click here to know more


If you have any test facility requirements or any subsystem to be tested at SAC facility, kindly fill up the form and email to "[email protected]"